In-situ infrared detection and heating of metallic phase of silicon during scratching test

Lei Dong, John A. Patten, Jimmie A. Miller. In-situ infrared detection and heating of metallic phase of silicon during scratching test. IJMTM, 7(5/6):530-539, 2005. [doi]

Authors

Lei Dong

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John A. Patten

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Jimmie A. Miller

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