ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications - researchr publication authors

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Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong (Paul) Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou. ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. Microelectronics Reliability, 79:201-205, 2017. [doi]

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