ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications

Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong (Paul) Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou. ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. Microelectronics Reliability, 79:201-205, 2017. [doi]

Abstract

Abstract is missing.