Guozhu Dong, Vahid Taslimitehrani. Pattern Aided Classification. In Sanjay Chawla Venkatasubramanian, Wagner Meira Jr., editors, Proceedings of the 2016 SIAM International Conference on Data Mining, Miami, Florida, USA, May 5-7, 2016. pages 225-233, SIAM, 2016. [doi]
Abstract is missing.