Zhuxin Dong, Uchechukwu C. Wejinya. Electrical properties measurement of Carbon Nanotubes using Atomic Force Microscope for nano sensor applications. In 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010, Xiamen, China, January 20-23, 2010. pages 819-823, IEEE, 2010. [doi]
@inproceedings{DongW10, title = {Electrical properties measurement of Carbon Nanotubes using Atomic Force Microscope for nano sensor applications}, author = {Zhuxin Dong and Uchechukwu C. Wejinya}, year = {2010}, doi = {10.1109/NEMS.2010.5592261}, url = {http://dx.doi.org/10.1109/NEMS.2010.5592261}, researchr = {https://researchr.org/publication/DongW10}, cites = {0}, citedby = {0}, pages = {819-823}, booktitle = {5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010, Xiamen, China, January 20-23, 2010}, publisher = {IEEE}, }