Yuran Dong, Cheng Xie, Luyao Xu, Hongming Cai, Weiming Shen 0001, Haoyuan Tang. Generative and Contrastive Combined Support Sample Synthesis Model for Few-/Zero-Shot Surface Defect Recognition. IEEE T. Instrumentation and Measurement, 73:1-15, 2024. [doi]
Abstract is missing.