Kevin D. Donohue, Chengwu Cui, M. Vijay Venkatesh. Wavelet Analysis of Print Defects. In PICS 2002: IS&T s PICS Conference, An International Technical Conference on Digital Image Capture and Associated System, Reproduction and Image Quality Technologies, April 2002, Portland, Oregon. pages 42-47, IS&T - The Society for Imaging Science and Technology, 2002. [doi]
Abstract is missing.