Accumulator based deterministic BIST

Rainer Dorsch, Hans-Joachim Wunderlich. Accumulator based deterministic BIST. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 412-421, IEEE Computer Society, 1998. [doi]

Authors

Rainer Dorsch

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Hans-Joachim Wunderlich

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