Rapid method for testing efficacy of nano-engineered coatings for mitigating tin whisker growth

Kyle Doudrick, Jeff Chinn, Jason Williams, Nikhilesh Chawla, Konrad Rykaczewski. Rapid method for testing efficacy of nano-engineered coatings for mitigating tin whisker growth. Microelectronics Reliability, 55(5):832-837, 2015. [doi]

Authors

Kyle Doudrick

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Jeff Chinn

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Jason Williams

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Nikhilesh Chawla

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Konrad Rykaczewski

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