Kyle Doudrick, Jeff Chinn, Jason Williams, Nikhilesh Chawla, Konrad Rykaczewski. Rapid method for testing efficacy of nano-engineered coatings for mitigating tin whisker growth. Microelectronics Reliability, 55(5):832-837, 2015. [doi]
@article{DoudrickCWCR15,
title = {Rapid method for testing efficacy of nano-engineered coatings for mitigating tin whisker growth},
author = {Kyle Doudrick and Jeff Chinn and Jason Williams and Nikhilesh Chawla and Konrad Rykaczewski},
year = {2015},
doi = {10.1016/j.microrel.2015.02.014},
url = {http://dx.doi.org/10.1016/j.microrel.2015.02.014},
researchr = {https://researchr.org/publication/DoudrickCWCR15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {5},
pages = {832-837},
}