Stuck-at fault diagnosis in scan chains - researchr publication authors

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Helen-Maria Dounavi, Yiorgos Tsiatouhas. Stuck-at fault diagnosis in scan chains. In Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2014, Santorini, Greece, May 6-8, 2014. pages 1-6, IEEE, 2014. [doi]

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