Helen-Maria Dounavi, Yiorgos Tsiatouhas. Stuck-at fault diagnosis in scan chains. In Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2014, Santorini, Greece, May 6-8, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{DounaviT14,
title = {Stuck-at fault diagnosis in scan chains},
author = {Helen-Maria Dounavi and Yiorgos Tsiatouhas},
year = {2014},
doi = {10.1109/DTIS.2014.6850663},
url = {http://dx.doi.org/10.1109/DTIS.2014.6850663},
researchr = {https://researchr.org/publication/DounaviT14},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2014, Santorini, Greece, May 6-8, 2014},
publisher = {IEEE},
}