Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests

Shawki Douzi, Moncef Kadi, Habib Boulzazen, Mohamed Tlig, Jaleleddine Ben Hadj Slama. Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests. Microelectronics Reliability, 88:219-224, 2018. [doi]

Abstract

Abstract is missing.