De-embedding method for on-wafer RF CMOS inductor measurements

Maria Drakaki, Alkis A. Hatzopoulos, Stylianos Siskos. De-embedding method for on-wafer RF CMOS inductor measurements. Microelectronics Journal, 40(6):958-965, 2009. [doi]

@article{DrakakiHS09,
  title = {De-embedding method for on-wafer RF CMOS inductor measurements},
  author = {Maria Drakaki and Alkis A. Hatzopoulos and Stylianos Siskos},
  year = {2009},
  doi = {10.1016/j.mejo.2009.01.003},
  url = {http://dx.doi.org/10.1016/j.mejo.2009.01.003},
  researchr = {https://researchr.org/publication/DrakakiHS09},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Journal},
  volume = {40},
  number = {6},
  pages = {958-965},
}