Fast stability analysis of large-scale SRAM arrays and the impact of NBTI degradation - researchr publication authors

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Stefan Drapatz, Thomas Fischer, Karl Hofmann, Ettore Amirante, Peter Huber, Martin Ostermayr, Georg Georgakos, Doris Schmitt-Landsiedel. Fast stability analysis of large-scale SRAM arrays and the impact of NBTI degradation. In 35th European Solid-State Circuits Conference, ESSCIRC 2009, Athens, Greece, 14-18 September 2009. pages 92-95, IEEE, 2009. [doi]

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