Automated test program generation for automotive devices - researchr publication authors

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Anke Drappa, Peter Huber, Jon Vollmar. Automated test program generation for automotive devices. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 1-10, IEEE, 2010. [doi]

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