At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories - researchr publication authors

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Xiaogang Du, Sudhakar M. Reddy, Wu-Tung Cheng, Joseph Rayhawk, Nilanjan Mukherjee. At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 895-900, IEEE Computer Society, 2004. [doi]

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