Boyang Du, Luca Sterpone. Fault tolerant electronic system design. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{DuS17-1,
title = {Fault tolerant electronic system design},
author = {Boyang Du and Luca Sterpone},
year = {2017},
doi = {10.1109/TEST.2017.8242080},
url = {https://doi.org/10.1109/TEST.2017.8242080},
researchr = {https://researchr.org/publication/DuS17-1},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3413-4},
}