Sensitivity and Reliability Analysis of the Development Level for Social Security System

Jianhua Du, Lijian Wang. Sensitivity and Reliability Analysis of the Development Level for Social Security System. In Lean Yu, Kin Keung Lai, S. K. Mishra, editors, Proceedings of the Second International Joint Conference on Computational Sciences and Optimization, CSO 2009, Sanya, Hainan, China, 24-26 April 2009, Volume 1. pages 340-343, IEEE Computer Society, 2009. [doi]

Abstract

Abstract is missing.