Chenguang Duan, Yuling Jiao, Lican Kang, Xiliang Lu, Jerry Zhijian Yang. Fast Excess Risk Rates via Offset Rademacher Complexity. In Andreas Krause 0001, Emma Brunskill, KyungHyun Cho, Barbara Engelhardt, Sivan Sabato, Jonathan Scarlett, editors, International Conference on Machine Learning, ICML 2023, 23-29 July 2023, Honolulu, Hawaii, USA. Volume 202 of Proceedings of Machine Learning Research, pages 8697-8716, PMLR, 2023. [doi]
Abstract is missing.