Chunting Duan, Kazuhiko Komatsu, Masayuki Sato 0001, Hiroaki Kobayashi. Multi-scale Loss based Electron Microscopic Image Pair Matching Method. In International Conference on Machine Learning and Applications, ICMLA 2023, Jacksonville, FL, USA, December 15-17, 2023. pages 1949-1956, IEEE, 2023. [doi]
Abstract is missing.