An Approach to T-Way Test Sequence Generation With Constraints - researchr publication authors

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Feng Duan, Yu Lei, Raghu N. Kacker, D. Richard Kuhn. An Approach to T-Way Test Sequence Generation With Constraints. In 2019 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2019, Xi'an, China, April 22-23, 2019. pages 241-250, IEEE, 2019. [doi]

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