Feng Duan, Yu Lei, Raghu N. Kacker, D. Richard Kuhn. An Approach to T-Way Test Sequence Generation With Constraints. In 2019 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2019, Xi'an, China, April 22-23, 2019. pages 241-250, IEEE, 2019. [doi]
@inproceedings{DuanLKK19,
title = {An Approach to T-Way Test Sequence Generation With Constraints},
author = {Feng Duan and Yu Lei and Raghu N. Kacker and D. Richard Kuhn},
year = {2019},
doi = {10.1109/ICSTW.2019.00059},
url = {https://doi.org/10.1109/ICSTW.2019.00059},
researchr = {https://researchr.org/publication/DuanLKK19},
cites = {0},
citedby = {0},
pages = {241-250},
booktitle = {2019 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2019, Xi'an, China, April 22-23, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0888-9},
}