Frequency characterization of memristive devices

Joao Capela Duarte, Ernesto Ventura Martins, Luis Nero Alves. Frequency characterization of memristive devices. In 21st European Conference on Circuit Theory and Design, ECCTD 2013, Dresden, Germany, September 8-12, 2013. pages 1-4, IEEE, 2013. [doi]

Abstract

Abstract is missing.