Multiple-time-instant 2D thermal mapping during a single ESD event - researchr publication authors

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Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik. Multiple-time-instant 2D thermal mapping during a single ESD event. Microelectronics Reliability, 44(9-11):1793-1798, 2004. [doi]

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