Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik. Multiple-time-instant 2D thermal mapping during a single ESD event. Microelectronics Reliability, 44(9-11):1793-1798, 2004. [doi]
@article{DubecBBHPDJSGG04,
title = {Multiple-time-instant 2D thermal mapping during a single ESD event},
author = {Viktor Dubec and Sergey Bychikhin and M. Blaho and Michael Heer and Dionyz Pogany and Marie Denison and Nils Jensen and Matthias Stecher and Gerhard Groos and Erich Gornik},
year = {2004},
doi = {10.1016/j.microrel.2004.07.087},
url = {http://dx.doi.org/10.1016/j.microrel.2004.07.087},
researchr = {https://researchr.org/publication/DubecBBHPDJSGG04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {9-11},
pages = {1793-1798},
}