Anuj Dubey, Aydin Aysu. A Full-Stack Approach for Side-Channel Secure ML Hardware. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 186-195, IEEE, 2023. [doi]
@inproceedings{DubeyA23,
title = {A Full-Stack Approach for Side-Channel Secure ML Hardware},
author = {Anuj Dubey and Aydin Aysu},
year = {2023},
doi = {10.1109/ITC51656.2023.00035},
url = {https://doi.org/10.1109/ITC51656.2023.00035},
researchr = {https://researchr.org/publication/DubeyA23},
cites = {0},
citedby = {0},
pages = {186-195},
booktitle = {IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4325-0},
}