Analysis of two dimensional image to obtain unique statistical features for developing image recognition techniques using wavelet approach

A. K. Dubey, A. Q. Ansari, R. P. Singh. Analysis of two dimensional image to obtain unique statistical features for developing image recognition techniques using wavelet approach. In B. K. Mishra, editor, Proceedings of the ICWET 11 International Conference & Workshop on Emerging Trends in Technology, Mumbai, Maharashtra, India, February 25 - 26, 2011. pages 66-70, ACM, 2011. [doi]

Abstract

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