Benoit Dubois, Jean-Baptiste Kammerer, Luc Hebrard, Francis Braun. Modelling of hot-carrier degradation and its application for analog design for reliability. Microelectronics Journal, 40(9):1274-1280, 2009. [doi]
@article{DuboisKHB09,
title = {Modelling of hot-carrier degradation and its application for analog design for reliability},
author = {Benoit Dubois and Jean-Baptiste Kammerer and Luc Hebrard and Francis Braun},
year = {2009},
doi = {10.1016/j.mejo.2008.03.017},
url = {http://dx.doi.org/10.1016/j.mejo.2008.03.017},
tags = {reliability, design},
researchr = {https://researchr.org/publication/DuboisKHB09},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {40},
number = {9},
pages = {1274-1280},
}