Fine-Grained Profiling for Data-Intensive Workflows

Nan Dun, Kenjiro Taura, Akinori Yonezawa. Fine-Grained Profiling for Data-Intensive Workflows. In 10th IEEE/ACM International Conference on Cluster, Cloud and Grid Computing, CCGrid 2010, 17-20 May 2010, Melbourne, Victoria, Australia. pages 571-572, IEEE, 2010. [doi]

Abstract

Abstract is missing.