Kirk A. Dunkelberger, O. Robert Mitchell. Contour tracing for precision measurement. In Proceedings of the 1985 IEEE International Conference on Robotics and Automation, St. Louis, Missouri, USA, March 25-28, 1985. pages 22-27, IEEE, 1985. [doi]
@inproceedings{DunkelbergerM85,
title = {Contour tracing for precision measurement},
author = {Kirk A. Dunkelberger and O. Robert Mitchell},
year = {1985},
doi = {10.1109/ROBOT.1985.1087356},
url = {http://dx.doi.org/10.1109/ROBOT.1985.1087356},
researchr = {https://researchr.org/publication/DunkelbergerM85},
cites = {0},
citedby = {0},
pages = {22-27},
booktitle = {Proceedings of the 1985 IEEE International Conference on Robotics and Automation, St. Louis, Missouri, USA, March 25-28, 1985},
publisher = {IEEE},
isbn = {0-8186-0615-0},
}