Absolute Depth Measurement Using Multiphase Normalized Cross-Correlation for Precise Optical Profilometry

Duc-Hieu Duong, Chin-Sheng Chen, Liang-Chia Chen. Absolute Depth Measurement Using Multiphase Normalized Cross-Correlation for Precise Optical Profilometry. Sensors, 19(21):4683, 2019. [doi]

@article{DuongCC19,
  title = {Absolute Depth Measurement Using Multiphase Normalized Cross-Correlation for Precise Optical Profilometry},
  author = {Duc-Hieu Duong and Chin-Sheng Chen and Liang-Chia Chen},
  year = {2019},
  doi = {10.3390/s19214683},
  url = {https://doi.org/10.3390/s19214683},
  researchr = {https://researchr.org/publication/DuongCC19},
  cites = {0},
  citedby = {0},
  journal = {Sensors},
  volume = {19},
  number = {21},
  pages = {4683},
}