Quoc-Tai Duong, Jerzy Dabrowski. Wideband RF detector design for high performance on-chip test. In NORCHIP 2012, Copenhagen, Denmark, November 12-13, 2012. pages 1-4, IEEE, 2012. [doi]
@inproceedings{DuongD12,
title = {Wideband RF detector design for high performance on-chip test},
author = {Quoc-Tai Duong and Jerzy Dabrowski},
year = {2012},
doi = {10.1109/NORCHP.2012.6403140},
url = {http://dx.doi.org/10.1109/NORCHP.2012.6403140},
researchr = {https://researchr.org/publication/DuongD12},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {NORCHIP 2012, Copenhagen, Denmark, November 12-13, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2221-8},
}