Pham Luu Trung Duong, Xuechu Xu, Qing Yang, Nagarajan Raghavan. Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures. Microelectronics Reliability, 88:85-90, 2018. [doi]
@article{DuongXYR18,
title = {Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures},
author = {Pham Luu Trung Duong and Xuechu Xu and Qing Yang and Nagarajan Raghavan},
year = {2018},
doi = {10.1016/j.microrel.2018.07.062},
url = {https://doi.org/10.1016/j.microrel.2018.07.062},
researchr = {https://researchr.org/publication/DuongXYR18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {85-90},
}