Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures

Pham Luu Trung Duong, Xuechu Xu, Qing Yang, Nagarajan Raghavan. Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures. Microelectronics Reliability, 88:85-90, 2018. [doi]

Abstract

Abstract is missing.