Failure modes on low voltage power MOSFETs under high temperature application

L. Dupont, Stéphane Lefebvre, M. Bouaroudj, Zoubir Khatir, Jean-Claude Faugières. Failure modes on low voltage power MOSFETs under high temperature application. Microelectronics Reliability, 47(9-11):1767-1772, 2007. [doi]

Authors

L. Dupont

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Stéphane Lefebvre

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M. Bouaroudj

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Zoubir Khatir

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Jean-Claude Faugières

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