L. Dupont, Stéphane Lefebvre, M. Bouaroudj, Zoubir Khatir, Jean-Claude Faugières. Failure modes on low voltage power MOSFETs under high temperature application. Microelectronics Reliability, 47(9-11):1767-1772, 2007. [doi]
@article{DupontLBKF07,
title = {Failure modes on low voltage power MOSFETs under high temperature application},
author = {L. Dupont and Stéphane Lefebvre and M. Bouaroudj and Zoubir Khatir and Jean-Claude Faugières},
year = {2007},
doi = {10.1016/j.microrel.2007.07.066},
url = {http://dx.doi.org/10.1016/j.microrel.2007.07.066},
researchr = {https://researchr.org/publication/DupontLBKF07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {9-11},
pages = {1767-1772},
}