Karthik Duraisami, Enrico Macii, Massimo Poncino. Using soft-edge flip-flops to compensate NBTI-induced delay degradation. In Fabrizio Lombardi, Sanjukta Bhanja, Yehia Massoud, R. Iris Bahar, editors, Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009. pages 169-172, ACM, 2009. [doi]
Abstract is missing.