Matias Duran, Xiao-Yi Zhang, Paolo Arcaini, Fuyuki Ishikawa. What to Blame? On the Granularity of Fault Localization for Deep Neural Networks. In Zhi Jin, Xuandong Li, Jianwen Xiang, Leonardo Mariani, Ting Liu, Xiao Yu, Nahgmeh Ivaki, editors, 32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021, Wuhan, China, October 25-28, 2021. pages 264-275, IEEE, 2021. [doi]
Abstract is missing.