Sai Raghuram Durbha, Amit Laknaur, Haibo Wang. Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 320-325, IEEE Computer Society, 2006. [doi]
Abstract is missing.