A methodologic project to characterize and model COTS component reliability

A. Durier, A. Bensoussan, M. Zerarka, C. Ghfiri, A. Boyer, Hélène Frémont. A methodologic project to characterize and model COTS component reliability. Microelectronics Reliability, 55(9-10):2097-2102, 2015. [doi]

Abstract

Abstract is missing.