Julia Dushina, Mike Benjamin, Daniel Geist. Semi-Formal Test Generation for a Block of Industrial DSP. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 131-137, IEEE Computer Society, 2001. [doi]
@inproceedings{DushinaBG01:0,
title = {Semi-Formal Test Generation for a Block of Industrial DSP},
author = {Julia Dushina and Mike Benjamin and Daniel Geist},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220131abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/DushinaBG01%3A0},
cites = {0},
citedby = {0},
pages = {131-137},
booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1122-8},
}