Serkan Dusmez, Mehrdad Heydarzadeh, Mehrdad Nourani, Bilal Akin. Remaining Useful Lifetime Estimation for Power MOSFETs Under Thermal Stress With RANSAC Outlier Removal. IEEE Trans. Industrial Informatics, 13(3):1271-1279, 2017. [doi]
@article{DusmezHNA17,
title = {Remaining Useful Lifetime Estimation for Power MOSFETs Under Thermal Stress With RANSAC Outlier Removal},
author = {Serkan Dusmez and Mehrdad Heydarzadeh and Mehrdad Nourani and Bilal Akin},
year = {2017},
doi = {10.1109/TII.2017.2665668},
url = {https://doi.org/10.1109/TII.2017.2665668},
researchr = {https://researchr.org/publication/DusmezHNA17},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {13},
number = {3},
pages = {1271-1279},
}