Serkan Dusmez, Mehrdad Heydarzadeh, Mehrdad Nourani, Bilal Akin. Remaining Useful Lifetime Estimation for Power MOSFETs Under Thermal Stress With RANSAC Outlier Removal. IEEE Trans. Industrial Informatics, 13(3):1271-1279, 2017. [doi]
No reviews for this publication, yet.