Slawomir Duszynski, Saura Jyoti Dhar, Tobias Beichter. Using relation graphs for improved understanding of feature models in software product lines: [industry]. In Thorsten Berger, Philippe Collet, Laurence Duchien, Thomas Fogdal, Patrick Heymans, Timo Kehrer, Jabier Martinez, Raúl Mazo, Leticia Montalvillo, Camille Salinesi, Xhevahire Tërnava, Thomas Thüm, Tewfik Ziadi, editors, Proceedings of the 23rd International Systems and Software Product Line Conference, SPLC 2019, Volume A, Paris, France, September 9-13, 2019. ACM, 2019. [doi]
Abstract is missing.