Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS - researchr publication authors

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Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos. Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. Microelectronics Reliability, 54(9-10):2289-2294, 2014. [doi]

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