Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos. Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. Microelectronics Reliability, 54(9-10):2289-2294, 2014. [doi]
@article{DutertreBPFRNS14,
title = {Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS},
author = {Jean-Max Dutertre and Rodrigo Possamai Bastos and Olivier Potin and Marie-Lise Flottes and Bruno Rouzeyre and Giorgio Di Natale and Alexandre Sarafianos},
year = {2014},
doi = {10.1016/j.microrel.2014.07.151},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.151},
researchr = {https://researchr.org/publication/DutertreBPFRNS14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {2289-2294},
}