Shantanu Dutt, Vinay Verma, Vishal Suthar. Built-in-Self-Test of FPGAs With Provable Diagnosabilities and High Diagnostic Coverage With Application to Online Testing. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(2):309-326, 2008. [doi]
@article{DuttVS08,
title = {Built-in-Self-Test of FPGAs With Provable Diagnosabilities and High Diagnostic Coverage With Application to Online Testing},
author = {Shantanu Dutt and Vinay Verma and Vishal Suthar},
year = {2008},
doi = {10.1109/TCAD.2007.906992},
url = {http://dx.doi.org/10.1109/TCAD.2007.906992},
tags = {test coverage, testing, diagnostics, coverage},
researchr = {https://researchr.org/publication/DuttVS08},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {27},
number = {2},
pages = {309-326},
}