Poster: EBFL-An Ensemble Classifier based Fault Localization

Arpita Dutta. Poster: EBFL-An Ensemble Classifier based Fault Localization. In 15th IEEE Conference on Software Testing, Verification and Validation, ICST 2022, Valencia, Spain, April 4-14, 2022. pages 473-476, IEEE, 2022. [doi]

Abstract

Abstract is missing.