Highly Efficient Layered Syndrome-based Double Error Correction Utilizing Current Summing in RRAM Cells to Simplify Decoder - researchr publication authors

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Shruti Dutta, Sai Charan Rachamadugu Chinni, Abhishek Das, Nur A. Touba. Highly Efficient Layered Syndrome-based Double Error Correction Utilizing Current Summing in RRAM Cells to Simplify Decoder. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-4, IEEE, 2023. [doi]

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